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Content associated with ARDI
ARDI offers access to scholarly literature from diverse fields of science and technology. It promotes the integration of developing and least developed countries into the global knowledge economy, reinforcing the knowledge infrastructure and supporting researchers in creating and developing new solutions to technical challenges on a local and global level.
! Optical Metrology and Inspection for Industrial Applications
Editor(s):
Harding, Kevin
Information Provider:
SPIE Digital Library
ISBN: 9780819483850
Publication Date:
2010
Book
! Optical Metrology and Inspection for Industrial Applications II
Editor(s):
Harding, Kevin
Information Provider:
SPIE Digital Library
ISBN: 9780819493187
Publication Date:
2013
Book
! Optical Metrology and Inspection for Industrial Applications III
Editor(s):
Han, Sen
Information Provider:
SPIE Digital Library
ISBN: 9781628413496
Publication Date:
2014
Book
! Optical Metrology and Inspection for Industrial Applications IV
Editor(s):
Han, Sen
Information Provider:
SPIE Digital Library
ISBN: 9781510604650
Publication Date:
2016
Book
! Optical Metrology and Inspection for Industrial Applications V
Editor(s):
Han, Sen
Information Provider:
SPIE Digital Library
ISBN: 9781510622364
Publication Date:
2018
Book
! Optical Metrology for Arts and Multimedia
Editor(s):
Salimbeni, Renzo
Information Provider:
SPIE Digital Library
ISBN: 9780819450166
Publication Date:
2003
Book
! Optical Metrology in Production Engineering
Editor(s):
Osten, Wolfgang
Information Provider:
SPIE Digital Library
ISBN: 9780819453792
Publication Date:
2004
Book
! Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries
Editor(s):
Al-Jumaily, Ghanim
Information Provider:
SPIE Digital Library
ISBN: 9780819437440
Publication Date:
2000
Book
! Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II
Editor(s):
Duparré, Angela
Information Provider:
SPIE Digital Library
ISBN: 9780819441638
Publication Date:
2001
Book
! Optical Metrology: A Critical Review
Editor(s):
Al-Jumaily, Ghanim
Information Provider:
SPIE Digital Library
E-ISBN: 9781510610521
Publication Date:
6360
Book
! Optical Micro- and Nanometrology III
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9780819481917
Publication Date:
2010
Book
! Optical Micro- and Nanometrology in Manufacturing Technology
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9780819453808
Publication Date:
2004
Book
! Optical Micro- and Nanometrology in Microsystems Technology
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9780819462442
Publication Date:
2006
Book
! Optical Micro- and Nanometrology in Microsystems Technology II
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9780819471932
Publication Date:
2008
Book
! Optical Micro- and Nanometrology IV
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9780819491220
Publication Date:
2012
Book
! Optical Micro- and Nanometrology V
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9781628410808
Publication Date:
2014
Book
! Optical Micro- and Nanometrology VI
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9781510601352
Publication Date:
2016
Book
! Optical Micro- and Nanometrology VII
Editor(s):
Gorecki, Christophe
Information Provider:
SPIE Digital Library
ISBN: 9781510618824
Publication Date:
2018
Book
! Optical Microlithographic Technology for Integrated Circuit Fabrication and Inspection
Editor(s):
Stover, Harry
Information Provider:
SPIE Digital Library
ISBN: 9780892528462
Publication Date:
1987
Book
! Optical Microlithography and Metrology for Microcircuit Fabrication
Editor(s):
Lacombat, Michel
Information Provider:
SPIE Digital Library
ISBN: 9780819401748
Publication Date:
1989
Book
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